Fujitsu Series 3 Manual
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7. Registers If you write a disabled value to a WWEC, WADC or WA CC bit, operation of the external bus interface is not guaranteed. In NAND flash memory mode, the MNWEX and MNREX timings are set by the timing registers as is the case with MWEX and MOEX. FUJITSU SEMICONDUCTOR LIMITED CHAPTER 23: External Bus Interface MN706-00002-1v0-E 1305 MB9Axxx/MB9Bxxx Series
7. Registers 7.3. Area Register 0 to Area Register 7 The following shows the configuration of the Area Register (0 to 7). bit 31 30 29 28 27 2625242322212019 18 17 16 Field Reserved MASK Attribute - R/W Initial value - 001111 (16MB width) bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Field Reserved ADDR Attribute - R/W Initial value - (from MCSX[0]) 00000000, 00010000, 00100000, 00110000, 01000000, 01010000, 01100000, 01110000 *1 [bit 22:16] MASK: address mask These bits set the value to mask the value set in ADDR. If 1 is set as a mask value, the external bus interface masks each of the internal bus and ADDR according to the value, and compares the masking results. If the results are matched, the external bus interface accesses the MCSX signal. Example: ADDR = 0b00001000 MASK = 0b 0000011 An example where a device is selected Internal bus address (External interface address) AD = 0x10900000 Masking ADDR & (!MASK) =0b00001000 AD [27:20] & (!MASK) =0b00001000 ….. Matched. The device is selected An example where a device is not selected Internal bus address (External interface address) AD = 0x10C00000 Masking ADDR & (!MASK) =0b00001000 AD [27:20] & (!MASK) =0b00001100 …..Not matched. The device is not selected An area size is selected for mask ing. In the example, 0x10800000 0x10B00000 (4 MB) is selected. A bit set to 1 for masking is lost during masking proces s. The bit is disabled even if it is set in ADDR. In the example, if LSB is set to 1 (ADDR=0b00001001), it is disabled during masking and the same address area is selected. The following example indicates the relationship between the mask settings and the address area size. 0b0000000 1MB 0b0000111 8MB 0b0000001 2MB 0b0001111 16MB 0b0000011 4MB 0b001 1111 32MB FUJITSU SEMICONDUCTOR LIMITED CHAPTER 23: External Bus Interface MN706-00002-1v0-E 1306 MB9Axxx/MB9Bxxx Series
7. Registers FUJITSU SEMICONDUCTOR LIMITED Chapter: External Bus Interface FUJITSU SEMICONDUCTOR CONFIDENTIAL 32 [bit 7:0] ADDR: Address These bits specify the address to set the corresponding MCSX area. The address is in the fixed 256 MB area assigned to the SRAM/flash memory interface. The address specified by bits 7:0 corresponds to the internal address [27:20]. No address areas must overlap other areas. If unused MCSX is accessed, operation of the exte rnal bus interface is also not guaranteed. CHAPTER 23: External Bus Interface MN706-00002-1v0-E 1307 MB9Axxx/MB9Bxxx Series
FUJITSU SEMICONDUCTOR LIMITED MN706-00002-1v0-E 1308 MB9Axxx/MB9Bxxx Series
1. Overview Chapter: Debug Interface This chapter explains the function and operation of the debug interface. 1. Overview 2. Pin Description CODE: 9BFDEBUG-E01.2 FUJITSU SEMICONDUCTOR LIMITED CHAPTER 24: Debug Interface MN706-00002-1v0-E 1309 MB9Axxx/MB9Bxxx Series
1. Overview 1. Overview This series contains a Serial Wire JTAG Debug Port (SWJ-DP). Connecting an ICE to the SWJ-DP allows system debugging. This series also contains an Embed ded Trace Macro Cell (ETM) for tracing instructions and a Trace Port Interface Unit (TPIU) that controls trace data. This section describes the functions of the pins to be used for debugging. For details on the SWJ-DP, ETM, TPIU and system debug, see Cortex-M3 Technical Reference Manual. Features Five pins are assigned to the SWJ-DP. These five pins are initially dedicated to the JTAG. It is possible to change their functions to the serial wire debug mode. It is possible to output inst ruction trace by selecting it from 4-bit trace data (TRACED0-3) and asynchronous trace data (SWO). FUJITSU SEMICONDUCTOR LIMITED CHAPTER 24: Debug Interface MB9Axxx/MB9Bxxx Series MN706-00002-1v0-E 1310
2. Pin Description 2. Pin Description This section describes pins. 2.1 Pins for Debug Purposes 2.2 ETM Pins 2.3 Functions Initially Assigned to Pins 2.4 Internal Pull-Ups of JTAG Pins FUJITSU SEMICONDUCTOR LIMITED CHAPTER 24: Debug Interface MN706-00002-1v0-E 1311 MB9Axxx/MB9Bxxx Series
2. Pin Description 2.1. Pins for Debug Purposes Five pins (TRSTX, TCK, TMS, TDI, and TDO) are assigned to the JTAG and two pins (SWCLK and SWDIO) are assigned to the serial wire. In addition, a Serial Wire Viewer signal (SWO) that outputs trace data is assigned. TMS is shared with SWDIO, TCK is shared with SWCLK, and TDO is shared with SWO. The following provides a list of pin functions in each debug mode. Table 2-1 SWJ-DP pin functions in debug mode Pin JTAG Serial Wire/Trace TCK/SWCLK TCK (JTAG Clock signal) SWCLK (Serial Wire Clock signal) TMS/SWDIO TMS (JTAG State Mode signal) SWDIO (Serial Wire Data Input/Output signal) TDI TDI (JTAG Data Input signal) - TDO/SWO TDO (JTAG Data Output signal) SWO (Serial Wire Viewer Output signal) TRSTX TRSTX (active-LOW JTAG Reset signal) - FUJITSU SEMICONDUCTOR LIMITED CHAPTER 24: Debug Interface MN706-00002-1v0-E 1312 MB9Axxx/MB9Bxxx Series
2. Pin Description 2.2. ETM Pins The ETM is assigned four trace outputs (TRACED0, TRACED1, TRACED2, and TRACED3) and one clock (TRACECLK). The following provides a list of pin functions in each debug mode. Table 2-2 Trace pin functions in debug mode Pin Trace TRACED0 Synchronous Trace Data Output signal TRACED1 Synchronous Trace Data Output signal TRACED2 Synchronous Trace Data Output signal TRACED3 Synchronous Trace Data Output signal TRACECLK Trace Clock signal FUJITSU SEMICONDUCTOR LIMITED CHAPTER 24: Debug Interface MN706-00002-1v0-E 1313 MB9Axxx/MB9Bxxx Series
2. Pin Description 2.3. Functions Initially Assigned to Pins The 10 pins - five JTAG pins and five ETM trace pins - are used also as GPIO. Five JTAG pins (TRSTX, TCK, TMS, TDI, and TDO) are initially dedicated to debug function, whereas five ETM pins (TRACED0, TRACED1, TRACED2, TRACED3, and TRACECLK) are not initially dedicated to that. When using this series, please configure these ETM pins to provide the debug function. Note: For details on how to set the debug function, see Chapter I/O Ports The following table provides initial states after resets are cleared and the functions that can be changed by setting PFRs (Port function registers). Note: For details on the PFRs, see Chapter I/O Ports. Table 2-3 Functions initially assigned to pins for debugging purposes and change of function Initially assigned pin function Change of function by setting the PFR TCK/SWCLK TCK GPIO TMS/SWDIO TMS GPIO TDI TDI GPIO TDO/SWO TDO GPIO JTAG pins TRSTX TRSTX GPIO TRACED0 GPIO TRACED0 TRACED1 GPIO TRACED1 TRACED2 GPIO TRACED2 TRACED3 GPIO TRACED3 ETM pins TRACECLK GPIO TRACECLK FUJITSU SEMICONDUCTOR LIMITED CHAPTER 24: Debug Interface MB9Axxx/MB9Bxxx Series MN706-00002-1v0-E 1314