Hitachi F7000 Instruction Manual

							2.2    Creating an Analysis Method 
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7 Load  
Click this button to read out saved analytical conditions.     
Upon clicking, the file opening window appears.    So, select an 
analytical condition file.   
8 Save  
When you click this button after setting the parameters, the 
analytical conditions can be saved by overwriting.    In case of a 
new analysis method, clicking this button displays the “Save As” 
window.    You must enter a file name for saving in this window.   
9 Save As   
Click this button for renaming the set conditions for saving.     
The “Save As” window appears, so enter a file name.   
  
						

							2.2.2 
2 - 5 
When you click the Instrument tab, the window in Fig. 2-4 appears.   
For the settable range of each parameter, refer to Appendix G.   
 
 
 
Fig. 2-4  Instrument Tab 
 
 
1 Scan mode   
Select a scan mode here.    In case of Synchronous, the abscissa 
of the graph stands for excitation wavelength.     
The unit indication of the abscissa becomes ‘EX/EM(nm).’   
2 Data mode   
Select a data mode.    The Luminescence mode is for measuring 
luminescence in the biological/chemical field.     
In this mode, only the sample side signal is acquired without 
performing ratio photometry.    The Phosphorescence mode is for 
acquiring only phosphorescence after extinction of excitation beam 
while turning a chopper on the excitation side.   
2.2.2 Instrument Tab 
 
 
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							2.2    Creating an Analysis Method 
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3 Chopping speed   
Select a chopping speed.    Setting is allowed when 
Phosphorescence is selected for Data mode.     
The Phosphorescence mode is for acquiring only phosphorescence 
after extinction of excitation beam while turning a chopper on the 
excitation side.    An increase in chopping speed makes the 
chopper turns faster.   
4 EM WL   
For the Excitation scan mode, enter the fixed wavelength on the 
emission side .    For the Synchronous scan mode, enter the start 
wavelength on the emission side.   
5 EX Start WL   
This is the start wavelength on the excitation side in wavelength 
scan.    Enter the shorter wavelength side of measuring wavelength 
range.  
6 EX End WL   
This is the end wavelength on the excitation side in wavelength 
scan.    Enter the longer wavelength side of measuring wavelength 
range.  
7 EX WL   
For the Emission scan mode, enter the fixed wavelength on the 
excitation side.   
8 EM Start WL   
This is the start wavelength on the emission side in wavelength 
scan.    Enter the shorter wavelength side of measuring wavelength 
range.  
9 EM End WL   
This is the end wavelength on the emission side in wavelength 
scan.    Enter the longer wavelength side of measuring wavelength 
range.  
10 Scan speed   
Set a wavelength scan speed.   
11 Delay  
After pressing the Measure button, measurement is started 
following the delay time set here.    It is used for temperature 
stabilization, etc.    In repeat measurement, it is the time until the 
start of the first measurement.    The delay time is invalid for the 
second and subsequent measurements.    
						

							2.2.2 
2 - 7 
12 EX Slit   
Select a slit width on the excitation side.   
13 EM Slit   
Select a slit width on the emission side.   
14 PMT Voltage   
A function for controlling the voltage of the photomultiplier detector 
(photomultiplier tube).    As a reference, changing from 400 V to 
700 V increases the data value about two digits and changing from 
700 V to 950 V increases it about 1 digit.   
When a check mark is put for PMT Voltage 0-1000V, the 
photomultiplier voltage is settable within a range from 0 to 1000 V.   
15 PMT Voltage 0-1000V   
When a check mark is put in this box, the photomultiplier voltage is 
settable within a range from 0 to 1000 V.   
16 Response  
When “Auto” is selected, response will be set automatically 
depending on scan speed.    Select “Auto” usually.   
17 Corrected spectra   
A function for determining the spectrum inherent to a sample by 
correcting the photometer wavelength characteristic using the 
saved instrument parameters, following measurement with the 
instrument parameters for photometer control.    If there are no 
instrument parameters for the wavelength range to be measured, 
only the wavelength range that allows correction is scanned.     
And if there is no wavelength area measurable, an error will occur.   
The Instrument Response command is provided in the Utility menu 
for operating this function.   
When this setting is at ON, “Corrected spectra” appears on the 
monitor window.    (See Fig. 1-43 in 1.6.)   
18 Shutter control   
The shutter can automatically be closed in other than measurement 
for slowing down sample deterioration due to the energy of 
excitation beam and opened when measurement starts.     
When you put a check mark at the head, the shutter will close, and 
open at start of measurement.    The shutter will close again when 
measuring wavelength begins returning to the start wavelength 
after measurement in the wavelength scan mode.    
						

							2.2    Creating an Analysis Method 
2 - 8 
19 Replicates  
Set the number of repeat measurements.   
An average spectrum can also be determined in repeat 
measurement.    Setting is available on the Processing tab (shown 
in Fig. 2-6).   
20 Cycle time   
Set a repetition interval.   
21 Range of corrected spectra   
Spectrum correction range is indicated.   
  
						

							2.2.3 
2 - 9 
When selecting the Monitor tab, the window in Fig. 2-5 appears.     
For the settable range of each parameter, refer to Appendix G.   
 
 
 
Fig. 2-5  Monitor Tab 
 
 
Assign the following parameters.   
 
1 Y-Axis Max (maximum)   
Enter a maximum value for Y-axis on the monitor window.   
2 Y-Axis Min (minimum)   
Enter a minimum value for Y-axis on the monitor window.   
3 Open data processing window after data acquisition   
Select whether or not to conduct data processing after sample 
measurement.    When selected (check mark is applied), an icon 
(as shown in 
) is displayed for the data 
processing window at the end of measurement.    And by opening 
this icon, data processing such as peak detection is available.   
2.2.3 Monitor Tab 
 
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							2.2    Creating an Analysis Method 
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NOTE:  When the remaining memory capacity of PC in operation is 
very small (system resource is less than 20%), the data 
processing window will not open even if this item is turned ON.   
Either close the presently opened data processing window or 
restart the FL Solutions program.   
 
4 Open data processing window after acquisition (Overlay)   
Select whether or not to conduct data processing with spectra 
overlaid after sample measurement.    This setting is unavailable in 
repeat measurement.   
5 Print report after data acquisition   
Select whether or not to print a report after sample measurement.   
When selected (check mark is applied), printing will be made 
automatically after measurement.     
The items set at the Report tab will be printed.    When this item is 
not selected, data processing is allowed by reading out a file via 
[File]-[Open].  
6 Overlay  
Spectra can be overlaid in the monitor window.   
This setting cannot be selected for repeat measurement.   
 
  
						

							2.2.4 
2 - 11 
On selection of the Processing tab, the window in Fig. 2-6 will be 
displayed.  
For the settable range of each parameter, refer to Appendix G.   
 
 
 
Fig. 2-6  Processing Tab 
 
 
1 CAT (Computing for Averaging Transient)   
Valid when 2 or larger value is entered for Replicates at the 
Instrument tab.   
When a check mark is put at the head, an average spectrum is 
determined upon carrying out repeat measurement.   
This is especially effective for measuring samples with which the 
emission intensity varies with time.   
2 Processing choices   
A list of data processing is displayed.    Select a data processing 
item, and click the Right arrow button (
).  Then, the selected 
method appears in the Processing steps field.    For example, 
select ‘Derivative’ and click 
, then ‘Derivative’ is displayed in 
the Processing steps field as shown in Fig. 2-7.   
2.2.4 Processing Tab 
 
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							2.2    Creating an Analysis Method 
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Fig. 2-7   
 
 
3 Processing steps   
The processing sequence is displayed.    After measurement, data 
processing will be carried out in the order set here.   
How to Delete a Processing Method   
Select a processing method to be deleted and click the Left 
arrow button (
).    Then, the selected method disappears 
from the Processing steps field.   
 
Display and Change of Parameter   
When you click [+] in the Processing steps field, a parameter list 
is displayed.    Click a parameter name to be changed, and it 
becomes changeable.    For changing a ‘Derivative’ parameter, 
click [+] at the left of ‘Derivative’ in Fig. 2-7.    The present 
derivative parameters (Derivative order, Smoothing order, 
Number of points) are displayed.    For changing the derivative 
order, click ‘Derivative order,” and it is highlighted as shown in 
Fig. 2-8 to allow your change.   
 
 
 
Fig. 2-8 
  
						

							2.2.4 
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4 Peak Finding:  Integration method  
Select an integration method for the peaks to be displayed in the 
data processing window.   
5 Peak Finding:  Threshold  
Enter the minimum photometric value difference (between peak 
and valley) for definition as a peak.   
 
 
 
 
6 Peak Finding:  Sensitivity  
Select the number of data points in the horizontal axis direction 
(abscissa).    For detecting sharp peaks, select a sensitivity value of 
“1.”    Or select “8” for detecting broad peaks.   
 
 
Peak
Min. peak-valley 
difference 
Valley