Mitel Sx 200 Ml Pabx Lightware 16 Instructions Guide

							The Maintenance Manager 
device identification 
device status 
background diagnostics on / off 
power up diagnostics on / off 
number of background tests pending 
number of system tests pending 
number of power up tests pending 
number of fault isolation tests pending 
number of power up diagnostic retries 
number of fault diagnostic retries 
number of user specified diagnostic retries 
number of requests for this card  DEV PLID bay / slot / circuit / subcircuit 
CARDTYPE type of card 
CARDSTAT status of the card 
NUM CCTS number of circuits on the card 
DEV SWID software identity of the device 
DWA ADD device work area address 
CMOS ADD device CMOS address 
DEV 
STATUS 
BGR 
PWR 
BGR 
SYS 
PUP 
FIS 
PRT 
FRT 
USR 
CARD REQ 
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							General Maintenance Information 
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							5 Diagnostic Tests 
General 
5.1 For each physical device in the SX-200 ML PABX there is a special set of diagnostic 
tests specifically designed to test the device as thoroughly as possible. If faults are 
detected, broader ranges of tests may be run in an attempt to isolate the fault to the 
board level, and to ensure that isolated faults are not merely side effects of other 
problems. 
Diagnostics are divided into four different functional groups to facilitate the different 
characteristics of the various devices in the system. For example, a line circuit may be 
tested at any time, whereas the system RAM or the CPU may not, because the system 
software requires them at all times. Table 5-l describes the four types of diagnostic 
tests. Table 5-2 shows which devices are tested by each of the four types of diagnostics. 
Diagnostic Type 
PROM-Based 
1 Power-up 
Background 
Directed 
Table 5-I Diagnostic Types 
Description 
These are the only tests that thoroughly verify the Main Control Card II and the 
Bay Control Card. They can be initiated only by resetting the system. 
If enabled (by default they are disabled), they run once, either at system initial- 
ization or installation of a card. These tests can be enabled from the maintenance 
terminal or the console. 
If enabled (by default they are disabled), they start running after power-up di- 
agnostics have completed, and run continuously. These tests can be disabled 
from the maintenance terminal or the console. 
These are tests initiated by the maintenance user from the maintenance termi- 
nal, console, or test line. 
Note: Power-up, Background, and Directed diagnostics are actually the same set of tests; the differ- 
ence lies only in the manner in which they are invoked. 
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							General Maintenance information 
Table 5-2 Diagnostic Coverage 
Device Type 
I Power-up Background Directed 
I 
PROM 
ONS Line (digital) 
w 
COV Line (digital) 
w 
OPS Line (digital) 
LS/GS Trunk (digital) 
DID Trunk (digital) yes 
w 
w 
E&M Trunk Module (digital) 
Digital Line Card (DNIC) 
yes yes 9s 
DTMF Receiver Module 
ws w yes 
Music-on-Hold /Paging Module (cannot be tested, because the device is always busy) 
System Printer n/a nla 
Main Control Card II 
Digital Signal Processor (DSP) 
Bay Control Card 
Tl Trunk 
1 PCM Channels 
I Datasets 
SUPERSE~400 Series Telephone Sets 
Main Control Card II Tests 
5.2 Because of the nature of the Main Control Card II, there is no need to test it in the 
on-line environment. Therefore, most testing is performed only on initialization (that 
is, on power-up and reset). These tests reside in the Main Control Card II’s onboard 
EPROM, and test virtually all of the card’s main functional blocks. If any of the tests 
should fail, a unique error code will be displayed on the dual 7-segment display status 
indicators located on the front panel of the card. These codes are shown in Table 7-l. 
Bay Control Card Tests 
5.3 Like the Main Control Card II, the Bay Control Card is not on-line. Therefore, most 
testing is performed only on initialization (power up and reset). The tests reside in the 
Bay Control Card’s on-board EPROM, and test most of the card’s functional blocks. If 
any of the tests should fail, the alarm LED on the card’s front panel will flash. 
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							Diagnostic Tests 
Peripheral Device Tests 
’ 5.4 There is a unique sequence of tests specifically designed for each type of peripheral 
device in the system. These test sequences include device-specific tests and 
common tests. The test sequences are described in Table 5-3 through Table 5-14. 
The actual tests are described in the following paragraphs. Refer to the Engineering 
hforrnat~on Practice for information on peripheral circuit hardware. 
AC CODEC loopback test: This test verifies the CODEC encode, decode, and filter 
functions as well as the PCM paths from the DX Matrix. Because this test will always 
follow the dc CODEC test, failure of this test will isolate the fault. 
AC hybrid loopback test: This test is similar to the ac CODEC loopback test, but 
carries the test further, to the hybrid. Again, if this test fails, the fault is isolated to the 
device under test. 
ACDC loopback test: This is the digital CODEC loopback test, used to determine if 
the PCM path and the digital signal processor are functioning from the Main Control 
DX module to the bay. After the dc CODEC test is performed, this test is called without 
involving the CODEC so the only difference between the two tests is the connection 
in the DX chip. Failure of this test will not isolate the fault to the CODEC under test. 
Check ADC ref voltage: This test verifies the operation of the Analog-to-Digital con- 
verter by checking the level on the PCM Encoder/Decoder (CODEC) reference source. 
All digital lines and trunks, with the exception the Digital Line Card, undergo this test. 
Check for a data set: This function checks for a DNIC data set connected to the device 
under test. This software test, providing information about the device, is an aid when 
deciding what hardware tests are to be done. 
Check for a voice set: This function checks for a DNIC voice set connected to the 
device under test. This software test, providing information about the device, is an aid 
when deciding what hardware tests are to be done. 
Check whether other half has a set: This function checks for a DNIC voice/data set 
connected to the other half of the circuit of the device under test. This software test, 
providing information about the device, is an aid when deciding what hardware tests 
are to be done. 
Conference test: A three-party conference is attempted. The test passes when the 
attempt is successful; otherwise, a failure of the device is indicated. 
Console status: This test verifies the operation of the console. It consists of a status 
message being sent from the console to the Maintenance Manager. If the test fails, 
the fault cannot be isolated to the console. 
Dataset loopback: This routine performs a dataset data loopback by forming a loop- 
back path from the dataset UART transmitter back to the UART receiver. Once the 
path is formed, a block of data is sent to the dataset, and the set should send the block 
back. The test passes if the data received is the same as the data sent. This loopback 
test is done over the D Channel. 
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							General Maintenance Information 
DC CODEC test: This test verifies the operation of the PCM paths from the DX Matrix 
to the CODEC on the peripheral card and back again. It also verifies the integrity of a 
tone transmitted from the Main Control Card’s digital signal processor (DSP) along 
these paths. If the test fails, it is not possible for the system to isolate the fault com- 
pletely. 
Digital bay type test: Used to decide which set of diagnostics to run. If this routine 
returns a pass, digital bay diagnostics are run. 
DNIC set bphone: This test sends bphone-test-request messages to a DNIC voice 
set. The set verifies the BPHONE chip interface by ensuring that it can read and write 
to/from some of the internal chip registers; then the set replies with a pass/fail message. 
Failure of the test will isolate the fault to the set itself. 
DNIC set eprom checksum: This test sends eprom-checksum-request messages 
to a DNIC voice/data set. The set performs a checksum test and replies with a pass 
or fail message. Failure of the test will isolate the fault to the set itself. 
DNIC set transducer earpiece: This test sends a transducer-register-contents mes- 
sage to a Digital SU/?WSE~telephone. The set replies with the contents of the trans- 
ducer control register. The contents are compared with the expected contents for the 
earpiece field in the call processing work area, and a pass or fail is determined. Failure 
of the test will isolate the fault to the set. 
DNIC set transducer microphone: This test sends a transducer-register-contents 
message to a Digital SWE%E~telephone. The set replies with the contents of the 
transducer control register. The contents are compared with the expected contents for 
the microphone field in the call processing work area, and a pass or fail is determined. 
Failure of the test will isolate the fault to the set itself. 
DNIC set transducer mouthpiece: This test sends a transducer-register-contents 
message to a Digital SWEK33telephone. The set replies with the contents of the 
transducer control register. The contents are compared with the expected contents for 
the mouthpiece field in the call processing work area, and a pass or fail is determined. 
Failure of the test will isolate the fault to the set. 
DNIC set transducer speaker: This test sends a transducer-register-contents mes- 
sage to a Digital SU/?WSE~telephone. The set replies with the contents of the trans- 
ducer control register. The contents are compared with the expected contents for the 
speaker field in the call processing work area, and a pass or fail is determined. Failure 
of the test will isolate the fault to the set. 
Receiver test: In this test, the digital signal processor sends digit tones to the receivers 
and verifies that the receiver correctly detects the digits. 
Switch hook test: This test verifies the ability of a line card to detect an off-hook for 
the device under test. 
lest DNIC input: This test is used to loop the data internally at DNIC input. Failure of 
the test will isolate the fault to the card, but will not isolate the fault to the particular 
DNIC chip on the card. 
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							Diagnostic Tests 
Test DNIC output: This test is used to loop the data internally at DNIC output. Failure 
of this test will isolate the fault to the particular DNIC chip under test on the card. 
Tone detection test: This test generates a test tone of 440 Hz, and loops it back to 
the digital signal processor. The energy level of the tone must fall in a particular range 
to pass this test. Failure of the test indicates a faulty device. 
Tone generation test: This test collects two consecutive samples from the digital 
signal processor for a test tone of 440 Hz. The validity of the two samples is checked 
to determine a pass or fail. Failure of the test indicates a faulty device. 
Test Tl channel: This test is used to loop back one Ti trunk channel and check 
whether everything is OK. Failure of the test will isolate the fault to this particular 
channel. 
Table 5-3 OPS Line Card Initialization 
Diagnostic State Test Name Circuit State If Test 
Passes Circuit State If Test Fails 
I State 1 adc reference test state 2 1 device failure unisoiated 
State 2 
State 3 digital 
CODEC test 
digital CODEC 
loopback test state 3 
state 4 device failure unisolated 
device failure unisolated 
r 
State 4 analog CODEC state 5 device failure isolated 
loopback test 
I State 5 1 hookswitch test 1 passed 1 device failure isolated 
State 6 message lamp test passed device failure isolated 
Table 5-4 ONS Circuit Lamp Test Initialization 
Test Name 1 Circuit State If Test Passes 1 Circuit State If Test Fails 1 
State I message lamp test device passed device failure isolated 
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							General Maintenance Information 
Table 5-5 CO Trunk Card initialization 
Diagnostic State Test Name Circuit State If Test 
Passes Circuit State If Test Fails 
State 1 
State 2 digital bay test 
adc reference test state 2 
state 3 state 10 
device failure unisolated 
I State 3 1 digital CODEC test 1 state 4 1 device failure unisolated 1 
I 
State 4 digital CODEC state 5 device failure isolated 
loopback test 
I 
State 5 
State 6 analog CODEC 
loopback test 
hybrid loopback test state 6 
device passed device failure isolated 
device failure isolated 
I State 9 1 get junctor test state 10 state 22 
I 
I State 10 1 junctor dc CODEC test 1 state 11 state 13 
I 
I State 11 1 junctor ac CODEC test 1 state 12 state 13 
I 
I State 12 1 junctor test state 14 state 13 
I 
I State 13 make junctor suspect state 9 state 9 I 
State 14 
State 15 
State 16 
State 17 
State 18 
State 19 analog DSP test state 9 state 15 
retest primary state 15 state 16 
retest secondary state 16 state 17 
has junctor been state 18 device failure isolated 
isolated 
analog alternate device state 19 state 20 
test 
analog alt dev loopback device failure isolated state 18 
test 
State 20 enough alt devices state 21 device failure isolated 
State 21 
State 22 make junctor suspect 
enough junctors device passed 
device passed device passed 
device passed 
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							Diagnostic Tests 
Table 5-6 DID Trunk Card Initialization 
Diagnostic 
State 
State 1 
State 2 
State 3 
State 4 Test Name Circuit State if Test 
Passes Circuit State if Test Fails 
acfc reference test state 2 device failure unisolated 
digital CODEC test state 3 device failure unisoiated 
digital CODEC state 4 device failure isolated 
loopback test 
analog CODEC device passed device failure isolated 
loopback test 
Table 5-7 Receiver Module Initialization 
Diagnostic 
State 
State 1 
State 2 
State 3 
State 4 Test Name 
digital CODEC test 
digital CODEC 
loopback test 
analog CODEC 
loopback test 
dtmf receiver test Circuit State if Test 
Passes 
state 2 
state 3 
state 4 
device passed Circuit State if Test Fails 
device failure unisolated 
device failure unisolated 
device failure isolated 
device failure isolated 
Table 5-8 Console Circuit Initialization 
I State 1 console test 
I State 2 console dc CODEC test state 3 
I State 3 console ac CODEC test device passed  Circuit State if Test 
Passes Circuit State if Test Fails 
device passed 1 device failure unisolated 1 
1 device failure unisolated 1 
1 device failure isolated 
I 
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							General Maintenance information 
Table 5-9 COV Card initialization 
Circuit State if Test 
Circuit State if Test Fails 
Circuit State if Test 
Circuit State if Test Fails 
Table 5-11 DID Card Initialization 
Circuit State if Test Fails 
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