Hitachi F 2500 Manual
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5 - 3 (3) General The parameters shown in Fig. 5-3 are provided under the General tab. Fig. 5-3 General Tab (a) Measurement (mode) Select a measurement mode from among the four listed below. Wavelength scan Time scan Photometry 3-D Scan Here, select “3-D Scan.” For Wavelength scan, time scan and Photometry, refer to Sections 2, 3 and 4. (b) Operator Enter an operator name. (c) Instrument The model of the connected instrument is indicated. (d) Sampling Standard When sample is exchanged manually. (e) Comments Enter a description or notes on measuring conditions. 5.2
5 - 4 (f) Load Click this button to read out saved analytical conditions. The file opening window appears upon clicking, so select an analytical conditions file. (g) Save By clicking this button after setting the parameters for all five tabs, the analytical conditions are saved. Clicking this button overwrites parameters on the existing ones. (h) Save As Click this button for renaming the set conditions for saving. The “Save As” window will appear, so enter a file name. (4) Instrument This window appears when 3-D Scan is selected for the Measurement under the General tab of the Analysis Method window. When you click the Instrument tab, the window in Fig. 5-4 appears. Fig. 5-4 Instrument Tab 5.2 Creating an Analysis Method
5 - 5 (a) Data mode Select either of the following data modes. The Phosphorescence mode is for acquiring only phosphorescence after extinction of excitation beam while turning a chopper on the excitation side. Fluorescence Phosphorescence (with Model F-4500) (b) EX Start WL This is the start wavelength for wavelength scan on the excitation side. Input the shorter wavelength side of measuring wavelength range. Model Input Range F-4500 0, 200 to 850 nm F-2500 0, 200 to 750 nm (c) EX End WL This is the end wavelength for wavelength scan on the excitation side. Input the longer wavelength side of measuring wavelength range. Model Input Range F-4500 0, 200 to 900 nm F-2500 0, 200 to 800 nm (d) EX Sampling interval In the 3-dimensional measurement mode, emission spectrum measurement is repeated while shifting the excitation wavelength. Therefore, a shorter sampling interval on the excitation side will result in a longer measurement time. Input range: 1 to 50 nm (e) EM Start WL This is the start wavelength for wavelength scan on the emission side. Input the shorter wavelength side of measuring wavelength range. Model Input Range F-4500 0, 200 to 850 nm F-2500 0, 200 to 750 nm 5.2
5 - 6 (f) EM End WL This is the end wavelength for wavelength scan on the emission side. Input the longer wavelength side of measuring wavelength range. Model Input Range F-4500 0, 200 to 900 nm F-2500 0, 200 to 800 nm (g) EM Sampling interval In the 3-D Scan mode, emission spectrum measurement is repeated while shifting the excitation wavelength. Therefore, a shorter sampling interval on the emission side will result in a longer measurement time. Input range: 1 to 10 nm (h) Scan speed Set a scan speed. (Unit: nm/min) F-4500 F-2500 30000 3000 12000 1500 2400 300 1200 60 300 15 60 15 (i) EX Slit Select a slit width for the excitation side. Unit: nm F-4500 F-2500 1.0 2.5 2.5 5.0 5.0 10.0 10.0 20.0 20.0 5.2 Creating an Analysis Method
5 - 7 (j) EM Slit Select a slit width for the emission side. Unit: nm F-4500 F-2500 1.0 2.5 2.5 5.0 5.0 10.0 10.0 20.0 20.0 (k) PMT Voltage A function for controlling the voltage of the photomultiplier detector (photomultiplier tube). Select one of the following values. Changing from 400 V to 700 V increases the data value about two digits. 950 V (only with F-4500) 700 V 400 V (l) Response Select a response time from the following. F-4500 F-2500 0.04 0.04 0.01 0.08 0.05 0.4 0.1 2 0.5 8 2.0 Auto 8.0 Auto By selecting Auto, a response time is set automatically according to scan speed. Select Auto usually. 5.2
5 - 8 (m) Corrected spectra A function for determining the spectrum inherent to a sample by correcting the photometer wavelength characteristic using the saved instrument parameters, following measurement with the instrument parameters for photometer control. If there are no instrument parameters for the wavelength range to be measured, only the wavelength range that allows correction is scanned. And if there is no wavelength area measurable, an error will occur. For using this function, a Spectra Correction Parts Set (P/N 251-0126) is required. The Instrument Response command is provided in the Utility menu for operating this function. When this setting is at ON, “Corrected spectra” appears on the monitor window. (See Fig. 1-26 in 1.6.) (n) Shutter control (only with F-4500) The shutter can be automatically closed in other than measurement for suppressing sample deterioration due to the energy of excitation beam and opened when measurement starts. When you put a check mark at the head, the shutter will close and open at start of measurement. The shutter will close again when measuring wavelength begins returning to the start wavelength after measurement in the wavelength scan mode. 5.2 Creating an Analysis Method
5 - 9 (5) Monitor When selecting the Monitor tab, the window in Fig. 5-5 appears. Fig. 5-5 Monitor Tab Assign the following parameters. (a) Y-Axis Max (maximum) Input a maximum value for Y-axis on the monitor window. (b) Y-Axis Min (minimum) Input a minimum value for Y-axis on the monitor window. (c) Contour interval Function for setting intervals of drawing contour lines. Input range: 0.01 to 1000 (d) Open data processing window after data acquisition Select whether or not to conduct data processing after sample measurement. When selected (check mark is applied), an icon is displayed for the data processing window at the end of measurement. And by opening this icon, data processing such as peak detection is available. 5.2
5 - 10 NOTE: When the remaining memory capacity of PC in operation is very small (system resource is less than 20%), the data processing window will not open even if this item is turned ON. Either close the presently opened data processing window or restart the FL Solutions program. (e) Print report after data acquisition Select whether or not to print a report after sample measurement. When selected (check mark is applied), printing will be made automatically after measurement. The items set under the Report tab will be printed. When this item is not selected, data processing can be made by reading out a file via File- Open. (6) Processing On selection of the Processing tab, the window in Fig. 5-6 will be displayed. Fig. 5-6 Processing Tab (a) Peak Finding Select a peak detection method indicated in the data processing window. 5.2 Creating an Analysis Method
5 - 11 (b) Threshold Set a detection limit for the photometric value axis of peak and valley. Peaks or valleys below the setting will not be detected. Input range is 0.001 to 1000. (c) Sensitivity Select the number of data points in the horizontal axis direction (abscissa). Select a sensitivity of “1” for detecting sharp peaks. Or select “8” for detecting broad peaks. 1 2 4 8 (7) Report Select the Report tab, and the window in Fig. 5-7 will appear. Fig. 5-7 Report Tab (8) Output (a) Print Report A report will be printed. For printing method, refer to 5.7. (b) Use Microsoft® Excel Data will be transferred to Microsoft® Excel. For transfer method, refer to 6.13. 5.2
5 - 12 (c) Use print generator sheet Select this method for using the report generator (option). For usage, refer to the instruction manual of the report generator. (9) Orientation Selectable when Report is chosen for Print Method. Select a printing orientation. Either Portrait or Landscape orientation is selectable. When the Landscape orientation is selected, date and method can be printed. (a) Printable (transferable) items 1) Include date 2) Include instrument 3) Include graph Contour Bird’s-eye view Contour and bird’s-eye view Contour and Spectrum 4) Include peak table (b) Printer Font Click this button for changing the font to be used in the report. 5.2 Creating an Analysis Method