Mitel SX-200 DIGITAL Pabx Engineering Information Manual

							. . 
General Maintenance Information 
TABLE 5-2 
THE MAINTENANCE DEVICE WORK AREA 
The status of the card; one of: 
ther unplugged, or not installed 
maintenance 
- programme 
but not installed 
- not programmed in CDE 
- suspect - failed one diagnostic test 
- busied-out from the maintenance terminal, the console, the test 
line, or the manual switches (applies to analog trunks only) 
lated to this 
circuit 
Indicates for each circuit on the card, if power-up diagnostics are enabled. 
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							Genera! Maintenance Information 
6. DIAGNOSTIC TESTS 
General 
6.01 For each physical device in the SX-200@ DIGITAL PABX there is 
a special set of diagnostic tests specifically designed to test 
the device as thoroughly as possible. If faults are detected, broader 
ranges of tests may be run in an attempt to isolate the fault to the 
board level, and to ensure that isolated faults are not merely side 
effects of other problems. The diagnostics are divided into four dif- 
ferent functional groups. This is necessary to facilitate the different 
characteristics of the various devices in the system. For example, a 
line circuit may be tested at any time; whereas the system RAM or the 
CPU may not, as the system software requires them at all times. Note 
that cards in the analog bays may be tested only indirectly, by testing 
the voice paths that they are connected to. Table 6-1 describes the 
four types of diagnostic tests. Table 6-2 shows which devices are 
tested by each of the four types of diagnostics. 
TABLE 6-l 
DIAGNOSTIC TYPES 
Diagnostic Type Description 
PROM-Based These are the only tests that thoroughly verify the Main Control and 
Peripheral Control cards. They can be initiated only by resetting the system. 
Power-up 
Background 
Directed If enabled (by default they are not) run once, starting at system initialization. 
These tests can be enabled from the maintenance terminal or the console. 
If enabled, start running after power-up diagnostics have completed, and run 
continuously. These tests can be enabled from the maintenance terminal or 
the console. The default condition for this type of diagnostic test is “ON”. 
These are tests initiated by the maintenance user from the maintenance 
terminal, console, or test line. 
Note: Power-up, Background, and Directed diagnostics are actually the same set of tests; the 
difference lies only in the manner in which they are invoked. 
-- 
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							General Maintenance Information 
TABLE 6-2 
DIAGNOSTIC COVERAGE 
Device Type Power-up 
ONS Line (digital) 
ye= 
COV Line (digital) 
ye= 
OPS Line (digital) 
ye= Background 
ye= 
yes 
ye= Directed 
ye= 
ye= 
ye= PROM 
rLS/GS Trunk (digital) 
I ye= 
I ye= 
I ye= 
I I 
DID Trunk (digital) 
E&M Trunk Module (digital) 
DTMF Receiver Module 
Console Module yes 
ye= 
ye= 
ye= 
1 Music/Pager Module see Note 2 
[ System Printer 
I ye= 
I ye= 
I ye= 
I I 
Bav Control Card 
/ Analog Bay Control Cards 
I- ye= 
I 
I 8-Station Line (analog) see Note 1 
1 SUPERSET@ Line (analog) see Note 9 
ICOTrunk (analog) see Note 1 
DID Trunk (analog) 
E&M Trunk (analog) 
Tie Trunk (analog) see Note I 
see Note 1 
see Note 1 
Notes: 1. Analog devices may only be tested indirectly, through the testing of the Analog 
Junctors. 
2. Music/Pager module cannot be tested, as the device is always busy. 
Main Control Card Tests 
6.02 Due to the nature of the Main Control Card, it is not possible to 
thoroughly test it in the on-line environment. Therefore, most 
testing is performed only on initialization (i.e., power-up and reset). 
These tests reside in the Main Control card’s onboard EPROM, and test 
virtually all of the card’s main functional blocks. If any of the tests 
should fail, a unique error code will be displayed on the dual 
7-segment display status indicators located on the front panel of the 
card. These codes are shown in Table 8-l. 
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							General Maintenance Information 
6.03 The following tests are performed on the Main Control Card: 
e Processor Viability Test 
l PROM Checksum Test 
e 
Dynamic RAM Chip Select independence Test 
l Dynamic RAM Data Bit independence Test 
0 
Memory Address Line Independence Test 
0 
Memory Address Space Independence Test 
l DMA Controller Test. 
Bay Control Card Tests 
6.04 
Like the Main Control card, it is not possible to thoroughly test 
the Bay Control card in the on-line environment. Therefore, 
most testing is performed only on initialization (power up and reset). 
The tests reside in the Bay Control card’s on-board EPROM, and test 
most of the card’s functional blocks If any of the tests should fail, the 
alarm LED on the card’s front panel will flash. 
6.06 The following tests are performed on the Bay Control card: 
0 Processor Viability Test 
0 
PROM Checksum Test 
a 
Dynamic RAM Chip Select Independence Test 
l Dynamic RAM Data Bit Independence Test . 
0 
Memory Address Line Independence Test 
l Memory Address Space lndipendence Test. 
Peripheral Control Complex Tests 
6.06 The Peripheral Control Complex consists of one Peripheral Con- 
trol (PCC) Card, one Digital Interface (DIC) Card, and one Scan- 
ner card. Like the Main Control card, it is not possible to thoroughly 
test the Peripheral Control card, in the on-line environment. Therefore, 
testing is performed only on initialization (i.e., power-up and reset). 
These tests reside in the onboard EPROM on both the DIC card and the 
PCC, and test most of the functionality of the DIC and PCC cards, along 
with indirect testing of the Scanner card. If any of the tests should fail, 
a unique error code will be displayed on the dual -/-segment display 
status indicators located on the front panel of the Scanner card. These 
codes are shown in Tables 8-3 and 8-4. 
Peripheral Device Tests 
6.07 There is a unique sequence of tests specifically designed for 
each type of peripheral device in the system. These test se- 
quences include some device-specific tests along with some common 
tests. The test sequences are described in Tables 6-3 through 6-9. The 
actual tests are described in the following paragraphs. Refer to Sec- 
tions MITL9108-093-120-NA, LUGS Trunk Card Description and 
MITL9108-093-130-NA, ONS Line Card Description for information eon 
peripheral circuit hardware. 
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							General Maintenance Information ~ 
6.08 A/D Conversion Reference Test. This test verifies the opera- 
tion of the Analog-to-Digital converter by checking the level on 
the PCM Encoder/Decoder (CODEC) reference source. All digital lines 
and trunks undergo this test. 
6.09 inject Codec Test. This test verifies the operation of the PCM 
paths from the DX Matrix on the Main Control Card to the 
CODEC on the peripheral card, and back again; this includes the DX 
Data memory, and the peripheral backplane. The digital loopback capa- 
bilities of the CODEC are also verified. If this. test fails, it is not 
possible for the system to ascertain where the fault occurred (i.e., the 
DX Matrix, the peripheral backplane, or the peripheral card). 
6.10 Digital Codes Loopback Test. This test is similar to the Inject 
Codec Test, in that it verifies the operation of the PCM paths 
from the DX Matrix, to the CODEC on the peripheral card, and back 
again However, this test also verifies the integrity of a tone transmit- 
ted from the Main Control card’s digital signal processor (DSP) along 
these paths Once again, if the test fails, it is not possible for the 
system to isolate the fault completely. 
6.11 Analog Codec Loopback Test. This test is basically the same 
as the Digital Codec Loopback Test, but verifies the CODEC 
encode, decode and filter functions as well. Since this test will always 
follow the Digital Codec Loopback Test, failure of the test will isolate 
the fault to the CODEC itself. 
6.12 Hybrid Loopback Test. This test is similar to the Analog Codec 
Loopback Test, but carries the test further, to the hybrid. Again, 
if this test fails, the fault is isolated to the device under test. 
6.13 Switchhook Simulation Test. This test verifies about half of 
the line interface circuitry by simulating an off-hook condition 
on the Subscriber Line Interface Circuit (SLIC) hybrid. Note that the tip 
and ring leads are not disturbed by this test. If the test fails, the fault is 
isolated to the line circuit. Note that during this test the circuit LED on 
the line card will flash briefly. 
6.14 DTMF Receiver Frequency Test. This test verifies the ability of 
the DTMF Receiver circuit to correctly receive DTMF digits A 
series of DTMF digits are transmitted from the digital signal processor 
(DSP), along a PCM path, to the DTMF Receiver circuit; the received 
tone is then compared to the original tone. If the test fails, the fault is 
isolated to the DTMF receiver under test. 
6.15 Console Test. This test verifies the operation of the console; it 
consists of a status message being sent from the console to 
the Maintenance Manager. If the test fails, the fault cannot be isolated 
to the console. 
6.16 Junctor Force High/Low Test. If analog bays are present, this 
test verifies the operation of the analog junctors. This is done 
by ensuring that the junctor can independently be forced to high state, 
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							General Maintenance Information 
low state and ground state. If the test fails, the fault is isolated to the 
junctor under test. 
6.17 Junctor Digital Codec Loopback Test. This test, performed on 
analog bays, if present, is similar to the Digital Codec Loopback 
Test; it verifies operation of the PCM paths from the Main Controller 
Card to the Peripheral Control Card, to the CODEC on the DIC Card, 
and back again, using a tone transmitted from the tone generator. If 
the test fails, it is not possible for the system to isolate the fault. 
6.18 Junctor Analog Codec Loopback Test. This test, performed on 
analog bays, if present, is similar to the Junctor Digital Codec 
Loopback Test, but verifies the DIC CODEC encode, decode and filter 
functions as well. Since this test will always succeed the Junctor 
Digital Codec Loopback Test, failure of the test will isolate the fault to 
the DIC CODEC. 
6.19 Digital Signal Pocessor Test. There are four tests which verify 
the DSP on the Main Control card. These tests verify the DSP’s 
memory, conferencing capabilities, and ability to generate and detect 
tones. 
TABLE 6-3 
ONWOPS LINE DIAGNOSTIC SEQUENCE 
Diagnostic 
State Test Name Circuit State 
if Test Fails 
state 1 
state 2 
state 3 
state 4 
state 5 A/D conv reference 
Inject CODEC 
digital CODEC loopback 
analog CODEC loopback 
switchhook faulty, unisolated 
faulty, unisolated 
faulty, unisolated 
faulty, isolated 
faulty, isolated 
TABLE 6-4 
LWGS TRUNK DIAGNOSTIC SEQUENCE 
Diagnostic 
State 
I Test Name 
state 1 
state 2 
state 3 
state 4 
state 5 A/D conv reference 
Inject CODE6 
digital CODEC loopback 
analog CODEC loopback 
hybrid loopback faulty, unisolated 
faulty, unisolated 
faulty, unisolated 
‘faulty, isolated 
faulty, isolated 
TABLE 6-5 
DTMF RECEIVER DIAGNOSTIC SEQUENCE Circuit State 
if Test Fails 
Diagnostic 
State Test Name 
I 
Circuit State 
if Test Fails 
I 
state 1 
state 2 
state 3 
state 4 Inject CODEC 
digital CODEC loopback 
analog CODEC loopback 
DTMF tones faulty, unisolated 
faulty, unisolated 
faulty, isolated 
faulty, isolated 
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							General Maintenance Information 
TABLE 6-6 
CONSOLE DIAGNOSTIC SEQUENCE 
Diagnostic 
State Test Name Circuit State 
if Test Fails 
1 state 1 1 console. test 1 faulty, unisolated 
I 
TABLE 6-7 
ANALOG VOICE PATH (JUNCTOR) DIAGNOSTIC SEQUENCE 
Diagnostic 
State Test Name Circuit State 
if Test Fails 
state 1 junctor force hi/low faulty, unisolated 
state 2 junctor digital CODE6 faulty, unisolated 
state 3 junctor analog CODEC faulty, isolated 
TABLE 6-8 
COV LINE/E&M TRUNK DIAGNOSTIC SEQUENCE 
Diagnostic 
State Test Name Circuit State 
if Test Fails 
state 1 Inject CODEC faulty, unisolated 
state 2 digital CODEC loopback faulty, unisolated 
state 3 analog CODEC loopback faulty, isolated. 
TABLE 6-g 
DID TRUNK DIAGNOSTIC SEQUENCE 
Diagnostic 
State Test Name 
I 
Circuit State 
if Test Fails 
state 9 A/D conv reference 
faulty, unisolated 
state 2 Inject CODEC faulty, unisolated 
state 3 digital CODEC loopback faulty, unisolated 
state 4 analog CODEC loopback faulty, isolated 
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							General Maintenance information 
7. TEST LINE 
General 
7.01 The test line interface is designed to provide the maintenance 
person with a portable, inexpensive and readily available tool 
for diagnosing system failures and performing maintenance functions. 
A powerful subset of the maintenance functionality available via the 
maintenance terminal is available at the test line interface. In addition, 
the maintenance person can place calls without having a permanently 
wired extension on the premises. 
Connection to Test Line 
7.02 Two connection points for the test line are provided on the 
control maintenance panel on the control cabinet (see Figures 
3-3 and 3-4); either an RJ-11 jack type connector or a pair of “banana 
plugs” may be used. These connectors are hardwired directly from the 
control maintenance panel to the port located in Bay 2, Slot 1, Circuit 1 
of the control cabinet. The system will accept either rotary dial or 
DTMF dialing through this interface. 
Programming 
7.03 Before the test line package may be used, an access code must 
first be programmed through Customer Data Entry (CDE). In- 
formation on programming may be found in Section MITL9108-093- 
210-NA, Customer Data Entry. The user must first call up Form 02 
(Feature Access Codes). Once in this form, the user must assign an 
access code to Feature Number 18 (Maintenance Function - Test Line); 
this must not conflict with existing access codes or with the system 
numbering plan. 
Test Line Access 
7.04 To access test line, connect a set to one of the test line 
connectors on the maintenance panel. Lift the handset, wait for 
dial tone and enter the following: 
0 The test line access code; as specified in CDE 
e 
One of the valid test line command codes (see Table 7-1) 
l If required, enter the circuit location number or junctor number. 
Note that when CDE or maintenance is accessed via the maintenance 
terminal or Attendant Console, the test line cannot be accessed. In 
these cases, the user will receive busy tone upon dialing the test line 
access code. Also note that after accessing the test line, if no action is 
taken for 90 seconds, the test line session will be automatically termi- 
nated. 
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							General Maintenance Information 
TABLE 7-l 
TEST LINE COMMAND CODES 
COMMAND CODES 
Numeric 1 Alphabetic Description 
I 26 
I BO 
1 Busy-Out device 
I 
77 RS 
83 TD 
85 TJ Return device to Service 
Test Device 
Test Junctor 
I 25 I BJ I Busy-Out Junctor I 
I 
75 I RJ Return Junctor to service I 
Test Line Indicator LEDs 
7.05 The test line software uses the dual 7-segment display status 
indicators on the Main Control card as status indicators. When 
the user enters the test line access code on the test line-set, the LEDs 
go blank, indicating that, the system is waiting for command input. 
After the user enters a command sequence, the LEDs will display the 
results of the action performed. See Table 7-2. 
Test Line Tones 
7.06 The test line software uses some of the existing system- 
generated tones as audible status indicators. Approximately 10 
seconds after the user enters the test line access code on the test line 
set, a short ring burst, followed by dial tone is heard, indicating that 
the system is waiting for command input. After the user enters a 
command sequence, the returned tone will indicate the result of the 
action performed. See Table 7-3 for a complete list of the tones. 
Command Input 
7.07 Commands are entered on the test line by dialing command 
codes using the DTMF keypad or rotary dial of the set being 
used. These command codes are listed in Table 7-1. 
D 
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							General Maintenance Information 
Status Code 
PA 
E5 
, TABLE 7-2 
TEST LINE STATUS INDICATOR CODES 
Meaning 
The attempted operation was successful 
(pass). 
The attempted operation was unsuccessful 
(fail).* 
System is waiting for command input. 
Test was inconclusive. 
Fatal disk error; refer to Section 
MITL9108-093-350-NA, Troubleshooting. 
Invalid command or device location entered; 
only those commands in Table 7-l are 
acceptable. 
Diskette information has been loaded into 
RAM; insert new diskette (see paragraph 
7.22). 
Device was busy. Try again later. 
An invalid physical location number was 
entered. Enter bay number (e.g., 02), slot 
number (e.g., 04), and circuit number (e.g., 
06). 
Unknown error. Attempt operation again - 
ensure correct use of command codes (see 
Table 7-1). 
Error in acquiring the software ID of the 
testline. Attempt operation again - ensure 
correct use of command codes (see Table 
7-I). Use maintenance terminal or console if 
necessary. 
Possible software error. Attempt operation 
again - ensure correct use of command 
codes (see Table 7-l). Use maintenance 
terminal or console if necessary. 
*Failure of any of the test line command sequences will necessitate 
the use of the more sophisticated maintenance tools available from 
the maintenance terminal or console. Refer to Section MITL9108- 
093-351-NA. RS-232 Maintenance Terminal. 
Page 7-3