Toshiba Satellite L300 L305 Maintenance Manual

							
3  Diagnostic Programs  3.5 System Test 
 
5. CPU Protected Mode Test 
This test item is to check whether  CPU protected mode instruction works 
normally. 
6.  MMX  
The test item is to confirm whether the CPU supports MMX instructions. 
Subtest 02 Boards 
1. DMA Controller  
This test item is to check whethe r the DMA controller works normally.  
2. Interval Timer 
This test item is to check whether  the Interval Timer (18.2Hz, 55ms) works 
normally. 
3.  Clock/Calendar  
This test item is to check whet her the system clock/calendar works 
normally. 
4.  PCI System  
This test item is to check whethe r the bus number, device number and 
function number in PCI bus are valid. 
5.  Plug and Play 
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3.5 System Test  3  Diagnostic Programs 
This test item is to check:  
1. Whether the current system supports Plug-n-Play;  
2. Whether there is an ESCD (Extended System Configuration Data) in 
the BIOS; 
3.  Whether there is PCI-to-ISA bridge in the system; 
4. Whether there is PCI bus in the system. 
 
6. ACPI Test 
ACPI test includes two sub-items as below: 
System Address Map Test: Check the co rrectness of ACPI system memory 
map, and whether its mapping scop e is within real memory. 
ACPI Table Test: Check the correctne ss of ACPI relative configuration 
tables in the current system. 
Subtest 03  FAN Speed Test 
1. CPU Fan Speed Test 
This test item is to check whether the CPU fan currently used works 
normally in the different speeds of st op, slow, middle and fast. Below is the 
parameter setting dialog window. 
 
Set the range of Speed that is  to be tested, then choose the OK button to 
test it. It will be  displayed as follows: 
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3  Diagnostic Programs  3.5 System Test 
 
 
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3.6 Memory Test  3  Diagnostic Programs 
3.6 Memory Test 
This test module is to check whet her the memory chip works normally. 
Subtest 01  BIOS ROM  
This test item is to check the validity  of BIOS ROM that includes two sub-items --
ROM Read and ROM Write Protection. RO M Read is to check whether BIOS 
ROM could be correctly read out, ROM Wr ite Protect is to check whether BIOS 
ROM is write-protected. 
Subtest 02 Parity 
This test item is to check whether th e parity checkout error could happen through 
writing and reading memory. Below is the parameter setting dialog window. 
      
Test Option: Choose the Memory part to take  the test– Base Memory or 
Extended Memory. 
Extended Memory Test Range:  Specify the test coverage range of 
Extended Memory. If user chooses Total Size, it means that the whole 
Extended Memory will be tested. Although user can input the parameter 
into other select box, but  the selected result is invalid. If user chooses 
Special Size, the test of Extended Memory will be taken according to the 
coverage range that user chooses or time. 
Extended Memory Start Address (MB) & Extended Memory End 
Address (MB):  Set the range of extended memory that is to be tested, the 
test coverage would be based on the  setting and the value in ‘Percent (%) 
mentioned at below. 
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3  Diagnostic Programs  3.6 Memory Test 
Pattern Size: Choose the pattern size – BY TE, WORD, DWORD or ALL. 
Percent (%): Choose the percentage of the defined range of the memory to 
be tested. 
Time Limit(h): Choose or Input the time (hour)  of the defined range of the 
memory to be tested. 
Time Limit(m):  Choose or Input the time (minut e) of the defined range of 
the memory to be tested. 
Subtest 03 Patterns 
This test item is to check whether the  system memory includes base memory and 
extended memory that could be accessed correctly through writing and reading 
with a series of designed pattern data.  Below is the parameter setting dialog 
window. 
 
Test Option: Choose the Memory part to take  the test– Base Memory or 
Extended Memory. 
Extended Memory Test Range:  Specify the test coverage range of 
Extended Memory. If user chooses Total Size, it means that the whole 
Extended Memory will be tested. Although user can input the parameter 
into other select box, but  the selected result is invalid. If user chooses 
Special Size, the test of Extended Memory will be taken according to the 
coverage range that user chooses or time. 
Extended Memory Start Address (MB) & Extended Memory End 
Address (MB):  Set the range of extended memory that is to be tested, the 
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3.6 Memory Test  3  Diagnostic Programs 
Satellite L300D,Satellite Pro L300, EQUIUM L300,SATEGO L300 Mai ntenance Manual 37 
test coverage would be based on the setting and the value in ‘Percent (%) 
mentioned at below. 
Pattern Size:  Choose the pattern size – BY TE, WORD, DWORD or ALL. 
Percent (%): Choose the percentage of the defined range of the memory to 
be tested. 
Time Limit(h): Choose or Input the time (hour)  of the defined range of the 
memory to be tested. 
Time Limit(m):  Choose or Input the time (minut e) of the defined range of 
the memory to be tested. 
1.  Bit Stuck High Test 
Data pattern: Every bit is ‘1’ (Each bit is high) 
2. Bit Stuck Low Test 
Data pattern: Every bit is ‘0(Each bit is low); 
3. Checker Board Test 
Data pattern: Lo-byte and hi-byte  are composed with 0101(0x5) and 1010 
(0xA); 
4.  CAS Line Test 
Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 
1111(0xF); 
5. Incremental Test 
Data pattern: A series of increasing  data from 0 by adding 1 each time; 
6. Decrement Test 
Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by 
subtracting 1 each time; 
7. Incremental / Decrement Test 
Data Pattern is a series of data whos e low byte is increasing data from 0x00 
and high byte is decreasing data from 0xFF. 
Subtest 04   Extended Pattern  
						

							
3  Diagnostic Programs  3.6 Memory Test 
In addition to the above pattern test of th e memory, there is Read/Write Cycle test 
and Read Cycle Test for the extended memory. 
Below is the parameter dialog window of the extended pattern test. 
 
Test Range: Specify the test coverage range of Extended Memory. If 
user chooses Total Size, it means that the whole Extended Memory 
will be tested. Although user can inpu t the parameter into other select 
box, but the selected result is invalid.  If user chooses Special Size, the 
test of Extended Memory will be taken according to the coverage 
range that user chooses or time.  
Extended Memory Start Address and Extended Memory End 
Address (MB): Set the range of extended memory that is to be tested. 
The test coverage will be accordi ng to the value setting in ‘Percent 
(%)’ mentioned at below. 
Percent (%):  Choose the percentage of  the defined range of the 
memory to be tested. 
Time Limit(h): Choose or Input the time ( hour) of the defined range 
of the memory to be tested; 
Time Limit(m):  Choose or Input the time (minute) of the defined 
range of the memory to be tested. 
1.  Write/Read Cycle Test 
Test by using both read and write instructions. 
2. Read Cycle Test 
Test by using read instructions. 
Subtest 05  Walking 1’s Test 
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3.6 Memory Test  3  Diagnostic Programs 
The test item is to ensure that there is  no short circuitry issue in memory chip. The 
parameter dialog window is the same as that in ‘Subtest 02 Pattern’. 
Subtest 06  Walking 0’s Test 
The test item is to ensure that there is  no open circuitry issue in memory chip. The 
parameter dialog window is the same as that in ‘Subtest 02 Pattern’. 
Subtest 07  Address Test 
This test item is to check short and open issue on memory address lines . 
Subtest 08  Refresh Test 
This test item is to check whether the memory refresh works normally. The 
parameter dialog window is as follows: 
 
Subtest 09  Cache Memory 
The test item is to check whether the CPU internal cache memory could be 
accessed correctly. 
Subtest 10  Random Memory 
Random Memory test includes the followi ng two test items: Randomize Test and 
Random Incremental Read/Write Test. The parameter dialog window is the same 
as that in ‘Subtest 03 Extended Pattern’. 
1.  Randomize Test 
This test item is to check whether the memory could be correctly accessed 
with randomized data and randomized memory address. 
2. Random Increment Read/Write 
This test item is to check whether the memory could be correctly accessed 
with randomized memory address an d a series of incremental data. 
Subtest 11  Data Bus Test 
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3  Diagnostic Programs  3.6 Memory Test 
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This test item is to check whether the data bus works normally. 
Subtest 12  Memory Speed Test 
This test item is to check the data-transferring rate for the cache memory and the 
system memory.  
						

							
3.7 Storage  3  Diagnostic Programs 
3.7 Storage 
Subtest 01  HDD 
This test item runs on IDE hard disks. It checks the functions and performance of IDE 
hard disk. 
In order to protect user’s HDD data,  the password must be verified before the 
HDD test. The screen is as follows:
 
 
Password ：hard disk  
1. Sequential/Random R/W 
This test item is to check the HDD’s  Read/Write function through data writing 
and reading to HDD.
  
This test item needs user to submit the parameters: 
 
IDE HDD Test Range -- Specify the test coverage range of IDE HDD. If user 
chooses Total Size, it means that th e whole IDE HDD will be tested. Although 
user can input the parameter into other  select box, but the selected result is 
invalid. If user chooses Special Size, the test of IDE HDD will be taken 
according to the coverage range that user chooses or time. 
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